Relating the Evolution of Design Patterns and Crosscutting Concerns.

Authors :: Aversano, L.
Cerulo, L.
Di Penta, M.
Source :: Seventh IEEE International Working Conference on Source Code Analysis & Manipulation (SCAM 2007); 2007, p180-192, 13p
Publication Year :: 2007

Language :: English
ISBNs :: 9780769528809
Database :: Complementary Index
Journal :: Seventh IEEE International Working Conference on Source Code Analysis & Manipulation (SCAM 2007)
Publication Type :: Conference
Accession number :: 81276063
Full Text :: https://doi.org/10.1109/SCAM.2007.21