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Linear models for temperature and power dependence of thermal resistance in Si, InP and GaAs substrate devices.

Authors :
Walkey, D.J.
Smy, T.J.
MacElwee, T.
Maliepaard, M.
Source :
Seventeenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat. No.01CH37189); 2001, p228-232, 5p
Publication Year :
2001

Details

Language :
English
ISBNs :
9780780366497
Database :
Complementary Index
Journal :
Seventeenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat. No.01CH37189)
Publication Type :
Conference
Accession number :
81274893
Full Text :
https://doi.org/10.1109/STHERM.2001.915183