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Characterization of the parasitic bipolar amplification in SOI technologies submitted to transient irradiation.
- Source :
- RADECS 2001. 2001 6th European Conference on Radiation & Its Effects on Components & Systems (Cat. No.01TH8605); 2001, p217-222, 6p
- Publication Year :
- 2001
Details
- Language :
- English
- ISBNs :
- 9780780373136
- Database :
- Complementary Index
- Journal :
- RADECS 2001. 2001 6th European Conference on Radiation & Its Effects on Components & Systems (Cat. No.01TH8605)
- Publication Type :
- Conference
- Accession number :
- 81270100
- Full Text :
- https://doi.org/10.1109/RADECS.2001.1159283