Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?

Details

Language :

English

ISBNs :

9780769521190

Database :

Complementary Index

Journal :

Proceedings Ninth IEEE European Test Symposium, 2004 (ETS 2004)

Publication Type :

Conference

Accession number :

81267104

Full Text :

https://doi.org/10.1109/ETSYM.2004.1347649