New trends in health smart homes.

Authors :: Noury, N.
Virone, G.
Barralon, P.
Ye, J.
Rialle, V.
Demongeot, J.
Source :: Proceedings 18th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems; 2003, p118-127, 10p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780379602
Database :: Complementary Index
Journal :: Proceedings 18th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems
Publication Type :: Conference
Accession number :: 81258704
Full Text :: https://doi.org/10.1109/HEALTH.2003.1218728