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Enhanced analytic noise model for RF CMOS design.

Authors :
Koeppe, J.
Harjani, R.
Source :
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571); 2004, p383-386, 4p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780780384958
Database :
Complementary Index
Journal :
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)
Publication Type :
Conference
Accession number :
81248258
Full Text :
https://doi.org/10.1109/CICC.2004.1358828