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Enhanced analytic noise model for RF CMOS design.
- Source :
- Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571); 2004, p383-386, 4p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780780384958
- Database :
- Complementary Index
- Journal :
- Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)
- Publication Type :
- Conference
- Accession number :
- 81248258
- Full Text :
- https://doi.org/10.1109/CICC.2004.1358828