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Theoretical study of stubs for power line noise reduction [LSI applications].

Authors :
Nakura, T.
Ikeda, M.
Asada, K.
Source :
Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003; 2003, p715-718, 4p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780378421
Database :
Complementary Index
Journal :
Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003
Publication Type :
Conference
Accession number :
81248127
Full Text :
https://doi.org/10.1109/CICC.2003.1249493