Assessing reliability issues in cryogenically-operated SiGe HBTs.

Authors :: Chendong Zhu
Grens, C.
Enhai Zhao
Ahmed, A.
Cressler, J.D.
Joseph, A.J.
Source :: Proceedings of the Bipolar/BiCMOS Circuits & Technology Meeting, 2005; 2005, p41-44, 4p
Publication Year :: 2005

Language :: English
ISBNs :: 9780780393097
Database :: Complementary Index
Journal :: Proceedings of the Bipolar/BiCMOS Circuits & Technology Meeting, 2005
Publication Type :: Conference
Accession number :: 81245394
Full Text :: https://doi.org/10.1109/BIPOL.2005.1555197