Efficient loop-back testing of on-chip ADCs and DACs.

Authors :: Hak-soo Yu
Abraham, J.A.
Sungbae Hwang
Jeongjin Roh
Source :: Proceedings of the ASP-DAC Asia & South Pacific Design Automation Conference, 2003; 2003, p651-656, 6p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780376595
Database :: Complementary Index
Journal :: Proceedings of the ASP-DAC Asia & South Pacific Design Automation Conference, 2003
Publication Type :: Conference
Accession number :: 81245280
Full Text :: https://doi.org/10.1109/ASPDAC.2003.1195103