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Characterization and model of on-chip flicker noise with deep Nwell (DNW) isolation for 130nm and beyond SOC.
- Source :
- Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005 (ICMTS 2005); 2005, p125-129, 5p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780388550
- Database :
- Complementary Index
- Journal :
- Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005 (ICMTS 2005)
- Publication Type :
- Conference
- Accession number :
- 81234337
- Full Text :
- https://doi.org/10.1109/ICMTS.2005.1452242