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Controlling injected electron and hole profiles for better reliability of split gate SONOS.
- Source :
- Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2005 (IPFA 2005); 2005, p190-194, 5p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780393011
- Database :
- Complementary Index
- Journal :
- Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2005 (IPFA 2005)
- Publication Type :
- Conference
- Accession number :
- 81228371
- Full Text :
- https://doi.org/10.1109/IPFA.2005.1469159