Characterization of split gate flash memory endurance degradation mechanism.

Authors :: Wu, T.I.
Chih, Y.D.
Chen, S.H.
Wang, W.
Mi-Chang Chang
Shih, J.R.
Chin, H.W.
Wu, K.
Source :: Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743); 2004, p115-117, 3p
Publication Year :: 2004

Language :: English
ISBNs :: 9780780384545
Database :: Complementary Index
Journal :: Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743)
Publication Type :: Conference
Accession number :: 81228021
Full Text :: https://doi.org/10.1109/IPFA.2004.1345561