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Tester retargetable patterns.

Authors :
Kapur, R.
Williams, T.W.
Source :
Proceedings International Test Conference 2001 (Cat. No.01CH37260); 2001, p721-727, 7p
Publication Year :
2001

Details

Language :
English
ISBNs :
9780780371699
Database :
Complementary Index
Journal :
Proceedings International Test Conference 2001 (Cat. No.01CH37260)
Publication Type :
Conference
Accession number :
81222245
Full Text :
https://doi.org/10.1109/TEST.2001.966693