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An ILP formulation to optimize test access mechanism in system-on-chip testing.
- Source :
- Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159); 2000, p902-910, 9p
- Publication Year :
- 2000
Details
- Language :
- English
- ISBNs :
- 9780780365469
- Database :
- Complementary Index
- Journal :
- Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
- Publication Type :
- Conference
- Accession number :
- 81222141
- Full Text :
- https://doi.org/10.1109/TEST.2000.894301