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Achieving fault-tolerance by shifted and rotated operands in TMR non-diverse ALUs.

Authors :
Alderighi, M.
D'Angelo, S.
Metra, C.
Sechi, G.R.
Source :
Proceedings IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems; 2000, p155-163, 9p
Publication Year :
2000

Details

Language :
English
ISBNs :
9780769507194
Database :
Complementary Index
Journal :
Proceedings IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems
Publication Type :
Conference
Accession number :
81219420
Full Text :
https://doi.org/10.1109/DFTVS.2000.887153