Testable design and testing of high-speed superconductor microelectronics.

Authors :: Kerkhoff, H.G.
Joseph, A.A.
Heuvelmans, S.
Source :: Proceedings First IEEE International Workshop on Electronic Design, Test & Applications '2002; 2002, p8-12, 5p
Publication Year :: 2002

Language :: English
ISBNs :: 9780769514536
Database :: Complementary Index
Journal :: Proceedings First IEEE International Workshop on Electronic Design, Test & Applications '2002
Publication Type :: Conference
Accession number :: 81216194
Full Text :: https://doi.org/10.1109/DELTA.2002.994580