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Evolution of RFID Applications and Its Implications: Standardization Perspective.

Authors :
Byoung Nam Lee
Yong-Woon Kim
Hyoung Jun Kim
Source :
PICMET '07 - 2007 Portland International Conference on Management of Engineering & Technology; 2007, p903-910, 8p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781890843151
Database :
Complementary Index
Journal :
PICMET '07 - 2007 Portland International Conference on Management of Engineering & Technology
Publication Type :
Conference
Accession number :
81201423
Full Text :
https://doi.org/10.1109/PICMET.2007.4349409