Back to Search
Start Over
A multivariate statistical analysis of tool parameters to improve an erase failure of a flash memory device.
- Source :
- ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005; 2005, p132-135, 4p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780391437
- Database :
- Complementary Index
- Journal :
- ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005
- Publication Type :
- Conference
- Accession number :
- 81186527
- Full Text :
- https://doi.org/10.1109/ISSM.2005.1513316