Hot spot dynamics in quasivertical DMOS under ESD stress.

Authors :: Denison, M.
Blaho, M.
Silber, D.
Joos, J.
Jensen, N.
Stecher, M.
Dubec, V.
Pogany, D.
Gornik, E.
Source :: ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices & ICs, 2003; 2003, p80-83, 4p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780378766
Database :: Complementary Index
Journal :: ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices & ICs, 2003
Publication Type :: Conference
Accession number :: 81186120
Full Text :: https://doi.org/10.1109/ISPSD.2003.1225235