Modeling and Analysis of Leakage Induced Damping Effect in Low Voltage LSIs.

Authors :: Jie Gu
Keane, J.
Kim, C.
Source :: ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics & Design; 2006, p382-387, 6p
Publication Year :: 2006

Language :: English
ISBNs :: 9781595934628
Database :: Complementary Index
Journal :: ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics & Design
Publication Type :: Conference
Accession number :: 81185877
Full Text :: https://doi.org/10.1109/LPE.2006.4271873