Reliability of InGaAs/InP HBTs with InP passivation structure.

Authors :: Yamabi, R.
Kotani, K.
Kawasaki, T.
Yanagisawa, M.
Yaegassi, S.
Yano, H.
Source :: International Conference on Indium Phosphide & Related Materials, 2003; 2003, p122-125, 4p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780377042
Database :: Complementary Index
Journal :: International Conference on Indium Phosphide & Related Materials, 2003
Publication Type :: Conference
Accession number :: 81181975
Full Text :: https://doi.org/10.1109/ICIPRM.2003.1205328