Back to Search
Start Over
The impact of substrate bias on proton damage in 130 nm CMOS technology.
- Source :
- IEEE Radiation Effects Data Workshop, 2005; 2005, p117-121, 5p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780393677
- Database :
- Complementary Index
- Journal :
- IEEE Radiation Effects Data Workshop, 2005
- Publication Type :
- Conference
- Accession number :
- 81166754
- Full Text :
- https://doi.org/10.1109/REDW.2005.1532676