Fabrication and characterization of AFM probe with crystal-quartz tuning fork structure.

Details

Language :

English

ISBNs :

9780780394827

Database :

Complementary Index

Journal :

IEEE International Symposium on Micro-NanoMechatronics & Human Science, 2005

Publication Type :

Conference

Accession number :

81163914

Full Text :

https://doi.org/10.1109/MHS.2005.1589970