Cross-tie walls in 25-45 nm-thick Permalloy films.

Authors :: Redjdal, M.
Kakay, A.
Ruane, M.F.
Humphrey, F.B.
Source :: IEEE International Digest of Technical Papers on Magnetics Conference; 2002, pGR4-GR4, 1p
Publication Year :: 2002

Language :: English
ISBNs :: 9780780373655
Database :: Complementary Index
Journal :: IEEE International Digest of Technical Papers on Magnetics Conference
Publication Type :: Conference
Accession number :: 81161957
Full Text :: https://doi.org/10.1109/INTMAG.2002.1001459