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SiGe BiCMOS Trends - Today and Tomorrow.

Authors :
Dunn, J.
Harame, D.L.
Joseph, A.J.
St. Onge, S.A.
Feilchenfeld, N.B.
Lanzerotti, L.
Orner, B.
Gebreselasie, E.
Johnson, J.B.
Coolbaugh, D.D.
Rassel, R.
Khater, M.
Source :
IEEE Custom Integrated Circuits Conference 2006; 2006, p695-702, 8p
Publication Year :
2006

Details

Language :
English
ISBNs :
9781424400751
Database :
Complementary Index
Journal :
IEEE Custom Integrated Circuits Conference 2006
Publication Type :
Conference
Accession number :
81152474
Full Text :
https://doi.org/10.1109/CICC.2006.320882
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