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Nanolab: a tool for evaluating reliability of defect-tolerant nano architectures.

Authors :
Bhaduri, D.
Shukla, S.
Source :
IEEE Computer Society Annual Symposium on VLSI; 2004, p25-31, 7p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780769520971
Database :
Complementary Index
Journal :
IEEE Computer Society Annual Symposium on VLSI
Publication Type :
Conference
Accession number :
81149465
Full Text :
https://doi.org/10.1109/ISVLSI.2004.1339504