Nonuniform coupled VLSI interconnect characterisation using genetic algorithms.

Authors :: Cheldavi, A.
Safavi-Naeini, S.
Kamarei, M.
Source :: ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453); 2000, p165-168, 4p
Publication Year :: 2000

Language :: English
ISBNs :: 9789643600570
Database :: Complementary Index
Journal :: ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453)
Publication Type :: Conference
Accession number :: 81143785
Full Text :: https://doi.org/10.1109/ICM.2000.916437