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Excimer-laser activation of dopants in silicon: a new concept for a uniform treatment over a whole die area.

Authors :
Laviron, C.
Semeria, M.N.
Zahorski, D.
Stehle, M.
Hernandez, M.
Boulmer, J.
Debarre, D.
Kerrien, G.
Source :
Extended Abstracts of the Second International Workshop on Junction Technology. IWJT. (IEEE Cat.No.01EX541C); 2001, p91-94, 4p
Publication Year :
2001

Details

Language :
English
ISBNs :
9784891140199
Database :
Complementary Index
Journal :
Extended Abstracts of the Second International Workshop on Junction Technology. IWJT. (IEEE Cat.No.01EX541C)
Publication Type :
Conference
Accession number :
81135024
Full Text :
https://doi.org/10.1109/IWJT.2001.993835