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Successful quantum key distribution with simultaneous quadrature measurement in the presence of 90% line loss.

Authors :
Symul, T.
Lance, A.M.
Sharma, V.
Lam, R.K.
Weedbrook, C.
Ralph, T.C.
Source :
EQEC '05. European Quantum Electronics Conference, 2005; 2005, p302-302, 1p
Publication Year :
2005

Details

Language :
English
ISBNs :
9780780389731
Database :
Complementary Index
Journal :
EQEC '05. European Quantum Electronics Conference, 2005
Publication Type :
Conference
Accession number :
81132523
Full Text :
https://doi.org/10.1109/EQEC.2005.1567468