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Extraction of frequency dependent characteristic transmission line parameters up to 20 GHz for global wiring in 90 nm SOI/Cu technology.

Authors :
Winkel, T.-M.
Ktata, M.F.
Ludwig, T.
Grabinski, H.
Klink, E.
Source :
2004 Electrical Performance of Electronic Packaging; 2004, p131-134, 4p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780780386679
Database :
Complementary Index
Journal :
2004 Electrical Performance of Electronic Packaging
Publication Type :
Conference
Accession number :
81131459
Full Text :
https://doi.org/10.1109/EPEP.2004.1407565