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Determination of frequency dependent transmission line parameters on product related on chip test line structures using S-parameter measurements.

Authors :
Winkel, T.-M.
Ktata, M.F.
Ludwig, T.
Schettler, H.
Grabinski, H.
Klink, E.
Source :
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710); 2003, p97-100, 4p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780381285
Database :
Complementary Index
Journal :
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)
Publication Type :
Conference
Accession number :
81131344
Full Text :
https://doi.org/10.1109/EPEP.2003.1250008