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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices.
- Source :
- Asia & South Pacific Conference on Design Automation, 2006; 2006, p2-2, 1p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9780780394513
- Database :
- Complementary Index
- Journal :
- Asia & South Pacific Conference on Design Automation, 2006
- Publication Type :
- Conference
- Accession number :
- 81113285
- Full Text :
- https://doi.org/10.1109/ASPDAC.2006.1594661