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A mechanics-based strain gage methodology for solder joint reliability assessment.

Authors :
Mercado, L.L.
Girouard, S.
Hsieh, G.
Source :
Proceedings of the 5th International Conference on Thermal & Mechanical Simulation & Experiments in Microelectronics & Microsystems, 2004. EuroSimE 2004; 2004, p533-541, 9p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780780384200
Database :
Complementary Index
Journal :
Proceedings of the 5th International Conference on Thermal & Mechanical Simulation & Experiments in Microelectronics & Microsystems, 2004. EuroSimE 2004
Publication Type :
Conference
Accession number :
81105239
Full Text :
https://doi.org/10.1109/ESIME.2004.1304088