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Using quantum model of computation for reliability evaluation of defect tolerant nano-architectures.
- Source :
- 4th IEEE Conference on Nanotechnology, 2004; 2004, p622-624, 3p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780780385368
- Database :
- Complementary Index
- Journal :
- 4th IEEE Conference on Nanotechnology, 2004
- Publication Type :
- Conference
- Accession number :
- 81102213
- Full Text :
- https://doi.org/10.1109/NANO.2004.1392439