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Measured descent: a new embedding method for finite metrics.
- Source :
- 45th Annual IEEE Symposium on Foundations of Computer Science; 2004, p434-443, 10p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780769522289
- Database :
- Complementary Index
- Journal :
- 45th Annual IEEE Symposium on Foundations of Computer Science
- Publication Type :
- Conference
- Accession number :
- 81101277
- Full Text :
- https://doi.org/10.1109/FOCS.2004.41