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Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits.
- Source :
- 22nd IEEE International Symposium on Defect & Fault-Tolerance in VLSI Systems (DFT 2007); 2007, p508-516, 9p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9780769528854
- Database :
- Complementary Index
- Journal :
- 22nd IEEE International Symposium on Defect & Fault-Tolerance in VLSI Systems (DFT 2007)
- Publication Type :
- Conference
- Accession number :
- 81091657
- Full Text :
- https://doi.org/10.1109/DFT.2007.61