Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors.

Details

Language :

English

ISBNs :

9781424437818

Database :

Complementary Index

Journal :

2009 Design, Automation & Test in Europe Conference & Exhibition

Publication Type :

Conference

Accession number :

81072128

Full Text :

https://doi.org/10.1109/date.2009.5090705