Measurement of power supply noise tolerance of self-timed processor.

Authors :: Asada, K.
Sogabe, T.
Nakura, T.
Ikeda, M.
Source :: 2009 12th International Symposium on Design & Diagnostics of Electronic Circuits & Systems; 2009, p128-131, 4p
Publication Year :: 2009

Language :: English
ISBNs :: 9781424433414
Database :: Complementary Index
Journal :: 2009 12th International Symposium on Design & Diagnostics of Electronic Circuits & Systems
Publication Type :: Conference
Accession number :: 81064220
Full Text :: https://doi.org/10.1109/DDECS.2009.5012112