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Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing.
- Source :
- 2009 12th International Symposium on Design & Diagnostics of Electronic Circuits & Systems; 2009, p108-113, 6p
- Publication Year :
- 2009
Details
- Language :
- English
- ISBNs :
- 9781424433414
- Database :
- Complementary Index
- Journal :
- 2009 12th International Symposium on Design & Diagnostics of Electronic Circuits & Systems
- Publication Type :
- Conference
- Accession number :
- 81064216
- Full Text :
- https://doi.org/10.1109/DDECS.2009.5012108