Effect of random impurities on transport characteristics of nano-scale MOSFET.

Authors :: Mil'nikov, G.
Mori, N.
Kamakura, Y.
Ezaki, T.
Source :: 2008 International Conference on Simulation of Semiconductor Processes & Devices; 2008, p213-216, 4p
Publication Year :: 2008

Language :: English
ISBNs :: 9781424417537
Database :: Complementary Index
Journal :: 2008 International Conference on Simulation of Semiconductor Processes & Devices
Publication Type :: Conference
Accession number :: 81048064
Full Text :: https://doi.org/10.1109/SISPAD.2008.4648275