Temperature dependence and compensation in MOS dosimeters using bias controlled cycled measurement.

Details

Language :

English

ISBNs :

9781424427147

Database :

Complementary Index

Journal :

2008 IEEE Nuclear Science Symposium Conference Record

Publication Type :

Conference

Accession number :

81028228

Full Text :

https://doi.org/10.1109/NSSMIC.2008.4774575