Total Recovery of Defects Generated by Negative Bias Temperature Instability (NBTI).

Details

Language :

English

ISBNs :

9781424421947

Database :

Complementary Index

Journal :

2008 IEEE International Integrated Reliability Workshop Final Report

Publication Type :

Conference

Accession number :

81019657

Full Text :

https://doi.org/10.1109/IRWS.2008.4796075