Effective reduction of threshold voltage variability and standby leakage using advanced co-implantation and laser anneal for low power applications.

Details

Language :

English

ISBNs :

9781424423774

Database :

Complementary Index

Journal :

2008 IEEE International Electron Devices Meeting

Publication Type :

Conference

Accession number :

81019306

Full Text :

https://doi.org/10.1109/IEDM.2008.4796849