Characterization of MOSFETs intrinsic performance using in-wafer advanced Kelvin-contact device structure for high performance CMOS LSIs.

Details

Language :

English

ISBNs :

9781424418008

Database :

Complementary Index

Journal :

2008 IEEE International Conference on Microelectronic Test Structures

Publication Type :

Conference

Accession number :

81015842

Full Text :

https://doi.org/10.1109/ICMTS.2008.4509331