Two-in-One Implementation of Noise Reduction and Incline Emendation for Atomic Force Microscopic Images.

Details

Language :

English

ISBNs :

9781424415403

Database :

Complementary Index

Journal :

2008 IEEE Instrumentation & Measurement Technology Conference

Publication Type :

Conference

Accession number :

81009179

Full Text :

https://doi.org/10.1109/IMTC.2008.4547047