An array-based test circuit for fully automated gate dielectric breakdown characterization.

Details

Language :

English

ISBNs :

9781424420186

Database :

Complementary Index

Journal :

2008 IEEE Custom Integrated Circuits Conference

Publication Type :

Conference

Accession number :

81007945

Full Text :

https://doi.org/10.1109/CICC.2008.4672036