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Power performance of MBE-grown N-face high electron mobility transistors with AIN back barrier.

Authors :
Man Hoi Wong
Yi Pei
Rongming Chu
Rajan, S.
Swenson, B.L.
Brown, D.F.
Keller, S.
DenBaars, S.P.
Speck, J.S.
Mishra, U.K.
Source :
2008 Device Research Conference; 2008, p201-202, 2p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424419425
Database :
Complementary Index
Journal :
2008 Device Research Conference
Publication Type :
Conference
Accession number :
80995374
Full Text :
https://doi.org/10.1109/DRC.2008.4800802