Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction.

Details

Language :

English

ISBNs :

9783981080148

Database :

Complementary Index

Journal :

2008 Design, Automation & Test in Europe

Publication Type :

Conference

Accession number :

80995063

Full Text :

https://doi.org/10.1109/DATE.2008.4484724