Unravelling the free electron behavior in InN.

Authors :: Darakchieva, V.
Hofmann, T.
Schubert, M.
Sernelius, B.E.
Giuliani, F.
Xie, M.-Y.
Persson, P.O.A.
Monemar, B.
Schaff, W.J.
Hsiao, C.-L.
Chen, L.-C.
Nanishi, Y.
Source :: 2008 Conference on Optoelectronic & Microelectronic Materials & Devices; 2008, p90-97, 8p
Publication Year :: 2008

Language :: English
ISBNs :: 9781424427161
Database :: Complementary Index
Journal :: 2008 Conference on Optoelectronic & Microelectronic Materials & Devices
Publication Type :: Conference
Accession number :: 80994544
Full Text :: https://doi.org/10.1109/COMMAD.2008.4802099