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Carbon nanotube via interconnects with large current carrying capacity.

Authors :
Nihei, M.
Kawabata, A.
Sato, S.
Nozue, T.
Hyakushima, T.
Norimatsu, M.
Murakami, T.
Kondo, D.
Ohfuti, M.
Awano, Y.
Source :
2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p541-543, 3p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424421855
Database :
Complementary Index
Journal :
2008 9th International Conference on Solid-State & Integrated-Circuit Technology
Publication Type :
Conference
Accession number :
80988547
Full Text :
https://doi.org/10.1109/ICSICT.2008.4734598